BL12
Surface and interface science beamline
The soft X-ray beamline BL12 at the SAGA Light Source makes it possible to measure the surface electronic structures of many materials by X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy.
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Energy ranges |
40-200, 200-500, 500-1500 eV |
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Resolution (E/DE) |
2500 @ 400 eV |
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Photon flux (photons/sec) |
108 ~ 109 |
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Beam size (at XPS endstation) |
1.5 mm (H) × 0.6 mm (V) |
Area of research (keyword)
Using this beamline, the electronic structure and chemical bonding of material surfaces can be investigated. Examples of applications of synchrotron light for advanced industrial technology development include surface analysis of organic EL materials and ceramic phosphorous materials.